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The edge and bulk electron state dominated magnetotransport in multi-terminal single-crystalline refractory metal nanostructures

Mikhailov, G M; Chernykh, A V; Maan, J C; Lok, J G S; Geim, A K; Esteve, D; Joyez, P

Nanotechnology. 2000;11(4):379-382.

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Abstract

We have performed magnetotransport measurements in multi-terminal single-crystalline (001) molybdenum and tungsten nanostructures at 4.2 K. In such nanostructures with thicknesses of d = 90, 170, 290 and 340 nm and lead width w = 7d, the resistance is mainly due to electronic scattering by the boundaries of the device. An applied magnetic field changes the electronic trajectories and therefore modifies the surface scattering. In particular, in nanowires we have observed a strong reduction (respectively, increase) of the resistance when the magnetic field is directed parallel (respectively, perpendicular) to the current. When the mean free path of electrons is of the order of or larger than the lateral sample dimensions, the nanostructures exhibit strong geometric effects, such as longitudinal magnetic focusing and non-monotonic dependence of the bend resistance against the magnetic field. The latter is explained by crossover from the edge to the bulk state dominated electron transport in a moderate magnetic field, resulting in a re-entrance effect in the ballistic properties of cross-type nanostructures.

Bibliographic metadata

Type of resource:
Content type:
Published date:
Language:
english
Journal title:
Alternative journal title:
Nanotechnology
ISSN:
Volume:
11
Issue:
4
Start page:
379
End page:
382
Total:
4
Pagination:
379-382
ISI Accession Number:
ISI:000165958500038
Related website(s):
  • Related website <Go to ISI>://000165958500038
General notes:
  • 384RK Times Cited:11 Cited References Count:9
Access state:
Active

Institutional metadata

University researcher(s):

Record metadata

Manchester eScholar ID:
uk-ac-man-scw:192580
Created by:
Hawthornthwaite, Sabina
Created:
19th April, 2013, 14:56:22
Last modified by:
Hawthornthwaite, Sabina
Last modified:
19th April, 2013, 14:56:22

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