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Direct Submicron Topography in the Raster Electron-Microscope
Bezrukov, A V; Geim, A K; Dubonos, S V; Petrashov, V T
Pisma V Zhurnal Tekhnicheskoi Fiziki. 1987;13(16):971-974.
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Bibliographic metadata
Type of resource:
Content type:
Author(s):
Published date:
Language:
russian
Journal title:
Alternative journal title:
Pisma Zh Tekh Fiz+
ISSN:
Volume:
13
Issue:
16
Start page:
971
End page:
974
Total:
4
Pagination:
971-974
ISI Accession Number:
ISI:A1987K679300003
Related website(s):
- Related website <Go to ISI>://A1987K679300003
General notes:
- K6793 Times Cited:0 Cited References Count:2
Access state:
Active
Institutional metadata
University researcher(s):
Academic department(s):
Record metadata
Manchester eScholar ID:
uk-ac-man-scw:192647
Created by:
Hawthornthwaite, Sabina
Created:
19th April, 2013, 15:05:58
Last modified by:
Hawthornthwaite, Sabina
Last modified:
19th April, 2013, 15:05:58