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Structures and electric field effects in ferro-, ferri- and antiferro-electric liquid crystal devices.
Gleeson, Helen F
Molecular Crystals and Liquid Crystals. 2003;401:211-223.
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Abstract
A review. This paper reviews several exptl. studies of elec.-field effects in liq. crystal devices contg. ferroelec., antiferroelec. and ferrielec. liq. crystals. Small-angle X-ray scattering has been employed to study both rapid, reversible layer flexing and irreversible, high-field deformations in surface stabilized ferroelec. devices. New antiferroelec. materials are also considered and the tilt angle and chevron angle adopted in devices are described. Generally, the chevron angle is found to compare well with the steric tilt angle (.apprx.20 Deg) and is considerably lower than the optical tilt angle (.apprx.30 Deg). Both conventional and resonant X-ray scattering expts. have been used to probe the layer and interlayer structure and field-induced deformations in antiferroelec., ferrielec. and ferroelec. liq. crystal devices. It is found that the mechanism of the chevron to bookshelf transition is phase-dependant and is thresholdless in the ferroelec. phases of these materials. Further, resonant scattering reveals that the field-induced antiferroelec. or ferrielec. to ferroelec. transition can occur at field strengths that are similar to or higher than those required to deform the smectic layers. [on SciFinder (R)]
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