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Predictive modeling of composite material degradation using piezoelectric wafer sensors electromechanical impedance spectroscopy
Gresil, M.; Yu, L.; Sutton, M.A.; Guo, S.; Pollock, P
In: SPIE 8347-27: SPIE 8347-27; San Diego, USA. San Diego, USA; 2012.
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SPIE 8347-27
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San Diego, USA
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San Diego, USA
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Manchester eScholar ID:
uk-ac-man-scw:230526
Created by:
Gresil, Matthieu
Created:
1st August, 2014, 14:20:40
Last modified by:
Gresil, Matthieu
Last modified:
8th October, 2014, 13:33:24