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Predictive modeling of composite material degradation using piezoelectric wafer sensors electromechanical impedance spectroscopy

Gresil, M.; Yu, L.; Sutton, M.A.; Guo, S.; Pollock, P

In: SPIE 8347-27: SPIE 8347-27; San Diego, USA. San Diego, USA; 2012.

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Bibliographic metadata

Type of resource:
Content type:
Type of conference contribution:
Publication date:
Conference title:
SPIE 8347-27
Conference venue:
San Diego, USA
Place of publication:
San Diego, USA
Proceedings title:

Institutional metadata

University researcher(s):

Record metadata

Manchester eScholar ID:
uk-ac-man-scw:230526
Created by:
Gresil, Matthieu
Created:
1st August, 2014, 14:20:40
Last modified by:
Gresil, Matthieu
Last modified:
8th October, 2014, 13:33:24

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