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Multiresonance Effect in Type-I Edge-Localized Mode Control With Low n Fields on JET
Liang, Y; Gimblett, C G; Browning, P K; Devoy, P; Koslowski, H R; Jachmich, S; Sun, Y; Wiegmann, C
Physical Review Letters. 2010;105(6):065001.
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Abstract
Multiple resonances in the edge-localized mode (ELM) frequency (f(ELM)) as a function of the edge safety factor q(95) have been observed for the first time with an applied low n (= 1, 2) field on the JET tokamak. Without an n = 1 field applied, f(ELM) increases slightly from 20 to 30 Hz by varying the q(95) from 4 to 5 in a type-I ELMy H-mode plasma. However, with an n = 1 field applied, a strong increase in f(ELM) by a factor of 4-5 has been observed with resonant q(95) values, while the f(ELM) increased only by a factor of 2 for nonresonant values. A model, which assumes that the ELM width is determined by a localized relaxation triggered by an unstable ideal external peeling mode, can qualitatively predict the observed resonances when low n fields are applied.
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- Related website <Go to ISI>://WOS:000280555000003
- Liang, Y. Gimblett, C. G. Browning, P. K. Devoy, P. Koslowski, H. R. Jachmich, S. Sun, Y. Wiegmann, C.