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From One Electron to One Hole: Quasiparticle Counting in Graphene Quantum Dots Determined by Electrochemical and Plasma Etching
Neubeck, S; Ponomarenko, L A; Freitag, F; Giesbers, A J M; Zeitler, U; Morozov, S V; Blake, P; Geim, A K; Novoselov, K S
Small. 2010;6(14):1469-1473.
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Keyword(s)
afm lithography; graphene; graphite; quantum dots; quasiparticle energy spectra; scanning tunneling microscope
Bibliographic metadata
Type of resource:
Content type:
Author(s):
Published date:
Article title:
Language:
english
Journal title:
Alternative journal title:
Small
ISSN:
Volume:
6
Issue:
14
Start page:
1469
End page:
1473
Total:
5
Pagination:
1469-1473
Digital Object Identifier:
DOI 10.1002/smll.201000291
ISI Accession Number:
ISI:000280633900001
Related website(s):
- Related website <Go to ISI>://000280633900001
General notes:
- 635CT Times Cited:6 Cited References Count:26
Access state:
Active
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Academic department(s):
Record metadata
Manchester eScholar ID:
uk-ac-man-scw:192517
Created by:
Hawthornthwaite, Sabina
Created:
19th April, 2013, 14:50:55
Last modified by:
Hawthornthwaite, Sabina
Last modified:
19th April, 2013, 14:50:55